RELIABILITY OF 0.87 MU-M (AL,GA)AS DOUBLE HETEROSTRUCTURE LASERS WITH GA(AS,SB) ACTIVE LAYERS

被引：8

作者：

ANTHONY, PJ

ZILKO, JL

HARTMAN, RL

SCHUMAKER, NE

SWAMINATHAN, V

WAGNER, WR

机构：

来源：

ELECTRON DEVICE LETTERS | 1981年 / 2卷 / 02期

关键词：

D O I：

10.1109/EDL.1981.25336

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：50 / 52

页数：3

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