MICROWAVE-HEATING AND DIELECTRIC DIAGNOSIS TECHNIQUE IN A SINGLE-MODE RESONANT CAVITY

被引：16

作者：

JOW, J ^{[1
]}

HAWLEY, MC ^{[1
]}

FINZEL, MC ^{[1
]}

ASMUSSEN, J ^{[1
]}

机构：

[1] MICHIGAN STATE UNIV,DEPT ELECT ENGN,E LANSING,MI 48824

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 01期

关键词：

D O I：

10.1063/1.1140585

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：96 / 103

页数：8

共 22 条

[1] ACTIVE FREQUENCY TECHNIQUE FOR PRECISE MEASUREMENTS ON DYNAMIC MICROWAVE CAVITY PERTURBATIONS [J].

AKYEL, C ;

BOSISIO, RG ;

APRIL, GE .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1978, 27 (04) :364-368

[2]

[Anonymous], [No title captured]

[3] SINGLE-MODE OR CONTROLLED MULTIMODE MICROWAVE CAVITY APPLICATORS FOR PRECISION MATERIALS PROCESSING [J].

ASMUSSEN, J ;

LIN, HH ;

MANRING, B ;

FRITZ, R .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (08) :1477-1486

[4]

BONINCONTRO A, 1977, J PHYS E, V1232

[5]

BUCKMASTER HA, 1985, IEEE T MICROW THEORY, V33, P822, DOI 10.1109/TMTT.1985.1133138

[6]

CHAO S, 1983, IEEE T MICROWAVE THE, V33, P519

[7]

CONGER NL, 1967, REV SCI INSTRUM, V35, P384

[8] CAVITY PERTURBATION TECHNIQUES FOR MEASUREMENT OF MICROWAVE CONDUCTIVITY AND DIELECTRIC-CONSTANT OF A BULK SEMICONDUCTOR MATERIAL [J].

ELDUMIATI, II ;

HADDAD, GI .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1972, MT20 (02) :126-+

[9]

Harrington RF, 1961, TIME HARMONIC ELECTR, P348

[10]

HUANG HF, 1976, J MICROWAVE POWER, V11, P305

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