X-ray diffraction study of soda-boric oxide glass

被引：236

作者：

Biscoe, J ^{[1
]}

Warren, BE ^{[1
]}

机构：

[1] Massachusetts Inst Technol, George Eastman Lab Phys, Cambridge, MA USA

来源：

关键词：

D O I：

10.1111/j.1151-2916.1938.tb15777.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：287 / 293

页数：7

共 11 条

[1]

COUSEN A, 1928, J SOC GLASS TECHNOL, V12, P169

[2]

ENGLISH S, 1923, J SOC GLASS TECH, V7, P155

[3]

Gooding E. J., 1934, J SOC GLASS TECHNOL, V18, P32

[4]

SCHOLES SR, 1935, MODERN GLASS PRACTIC, P268

[5] Fourier analysis of X-ray patterns of soda-silica glass [J].

Warren, BE ;

Biscoe, J .

[6] Fourier analysis of X-ray patterns of vitreous SiO2 and B(2)O3 [J].

Warren, BE ;

Krutter, H ;

Morningstar, O .

[7] The atomic arrangement in glass [J].

Zachariasen, WH .

[8]

Zachariasen WH, 1932, Z KRISTALLOGR, V83, P354

[9]

ZACHARIASEN WH, 1937, Z KRISTALLOGR, V98, P270

[10]

1934, Z KRIST, V88, P150