Fourier analysis of X-ray patterns of soda-silica glass

被引：229

作者：

Warren, BE ^{[1
]}

Biscoe, J ^{[1
]}

机构：

[1] Massachusetts Inst Technol, Dept Phys, Cambridge, MA USA

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1938年 / 21卷 / 07期

关键词：

D O I：

10.1111/j.1151-2916.1938.tb15774.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：259 / 265

页数：7

相关论文

共 5 条

[1] Bragg W.L., 1937, ATOMIC STRUCTURE MIN
[2] COMPTON AH, 1935, XRAYS THEORY EXPT, P781
[3] X-ray diffraction study of the structure of soda-silica glass
Warren, BE
Loring, AD
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1935, 18 : 269 - 276
[4] Fourier analysis of X-ray patterns of vitreous SiO2 and B(2)O3
Warren, BE
Krutter, H
Morningstar, O
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1936, 19 : 202 - 206
[5] The structure of silica glass by X-ray diffraction studies
Warren, BE
Biscoe, J
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1938, 21 (02) : 49 - 54