INTERFACE ROUGHNESS AND PERIOD VARIATIONS IN MQW STRUCTURES DETERMINED BY X-RAY-DIFFRACTION

被引：60

作者：

FEWSTER, PF

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷

关键词：

D O I：

10.1107/S0021889888006569

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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页码：524 / 529

页数：6

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共 12 条

[1] Fewster P F, 1987, NATO ASI SER B-PHYS, V163, P417
[2] COMPOSITION AND LATTICE-MISMATCH MEASUREMENT OF THIN SEMICONDUCTOR LAYERS BY X-RAY-DIFFRACTION
FEWSTER, PF
CURLING, CJ
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (10) : 4154 - 4158
[3] FEWSTER PF, 1986, PHILIPS J RES, V41, P268
[4] FEWSTER PF, 1988, UNPUB
[5] X-RAY-DIFFRACTION STUDY OF INTER-DIFFUSION AND GROWTH IN (GAAS)N(AIAS)M MULTILAYERS
FLEMING, RM
MCWHAN, DB
GOSSARD, AC
WIEGMANN, W
LOGAN, RA
[J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (01) : 357 - 363
[6] GUINIER A, 1963, XRAY DIFFRACTION CRY, P279
[7] SOME ASPECTS OF THE X-RAY STRUCTURAL CHARACTERIZATION OF (GA1-XALXAS)N1(GAAS)N2 GAAS(001) SUPERLATTICES
KERVAREC, J
BAUDET, M
CAULET, J
AUVRAY, P
EMERY, JY
REGRENY, A
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (JUN) : 196 - 205
[8] A CORRECTION FOR THE ALPHA-1,ALPHA-2 DOUBLET IN THE MEASUREMENT OF WIDTHS OF X-RAY DIFFRACTION LINES
RACHINGER, WA
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (07): : 254 - 255
[9] X-RAY-DIFFRACTION STUDY OF A ONE-DIMENSIONAL GAAS-ALAS SUPERLATTICE
SEGMULLER, A
KRISHNA, P
ESAKI, L
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (FEB1) : 1 - 6
[10] A DYNAMICAL THEORY OF DIFFRACTION FOR A DISTORTED CRYSTAL
TAKAGI, S
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1969, 26 (05) : 1239 - &