SPECIMEN-EXCHANGE DEVICE FOR AN ULTRAHIGH-VACUUM ATOM-PROBE FIELD-ION MICROSCOPE

被引：4

作者：

WAGNER, A

HALL, TM

SEIDMAN, DN

机构：

[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853

[2] CORNELL UNIV,CTR MAT SCI,ITHACA,NY 14853

来源：

VACUUM | 1978年 / 28卷 / 12期

关键词：

D O I：

10.1016/0042-207X(78)90009-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：543 / 545

页数：3

共 19 条

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[3]

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[7] TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE FOR STUDY OF DEFECTS IN METALS [J].

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[8]

HALL TM, 1975, 2357 CORN U MAT SCI

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[10] HELIUM GAS-FLOW CRYOSTAT AND SPECIMEN AIRLOCK ASSEMBLY FOR ULTRAHIGH-VACUUM USE [J].

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