REAL-SPACE IMAGING OF SINGLE-LAYER MOS2 BY SCANNING TUNNELING MICROSCOPY

被引:78
作者
QIN, XR
YANG, D
FRINDT, RF
IRWIN, JC
机构
[1] Department of Physics, Simon Fraser University, Burnaby
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 07期
关键词
D O I
10.1103/PhysRevB.44.3490
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Single layers of MoS2 have been studied with a scanning tunneling microscope operating in air. The images obtained from films that were prepared by depositing an aqueous suspension of single-layer MoS2 on a graphite surface show that the unit cell of the single layers corresponds to an approximate 2a0 x a0 superlattice of the hexagonal 2H-MoS2 structure. The unit-cell parameters, in conjunction with previous measurements, imply that the single layers of MoS2 adopt a distorted octahedral structure. The image of dry restacked MoS2 transforms back to the hexagonal MoS2 pattern.
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页码:3490 / 3493
页数:4
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