FIRST RESULTS FROM THE SPECTROMICROSCOPY BEAMLINE AT THE ADVANCED LIGHT-SOURCE

被引:44
作者
DENLINGER, JD
ROTENBERG, E
WARWICK, T
VISSER, G
NORDGREN, J
GUO, JH
SKYTT, P
KEVAN, SD
MCCUTCHEON, KS
SHUH, D
BUCHER, J
EDELSTEIN, N
TOBIN, JG
TONNER, BP
机构
[1] UNIV WISCONSIN, DEPT PHYS, MILWAUKEE, WI 53211 USA
[2] UNIV OREGON, DEPT PHYS, EUGENE, OR 97403 USA
[3] UNIV CALIF BERKELEY, DEPT PHYS, BERKELEY, CA 94720 USA
[4] UPPSALA UNIV, S-75121 UPPSALA, SWEDEN
[5] UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV CHEM SCI, BERKELEY, CA 94720 USA
[6] LAWRENCE LIVERMORE NATL LAB, DEPT CHEM & MAT SCI, LIVERMORE, CA 94550 USA
关键词
D O I
10.1063/1.1145969
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The SpectroMicroscopy Facility at the Advanced Light Source is based on a high brightness, high-resolution beamline, and includes a collection of projects designed to exploit the unique characteristics of the soft x-ray beam. The beamline itself is comprised of a 5-m long, 5-cm-period undulator, a spherical-grating monochromator with water-cooled gratings. Adaptive optics refocus the monochromatic beam to two ''microfocus'' experimental stations with spot sizes less than 50 μm diameter and a third ''nanofocus'' station uses a zone-plate lens to further demagnify the microfocus spot. Experimental stations include an ''ultraESCA'' spectrometer for small-area spectroscopy and photoelectron diffraction, a scanning transmission x-ray microscope, and photoelectron microscopes. Commissioning experiments of microscopic actinide photoemission, surface-core-level photoelectron diffraction, and high-resolution soft x-ray fluorescence demonstrate dramatic improvements in sensitivity due to the high brightness and small focus of the beamline. © 1995 American Institute of Physics.
引用
收藏
页码:1342 / 1345
页数:4
相关论文
共 16 条
[1]   EXTENDED PHOTOEMISSION FINE-STRUCTURE ANALYSIS OF THE SI(111)-(7X7) SURFACE CORE LEVELS [J].
CARLISLE, JA ;
SIEGER, MT ;
MILLER, T ;
CHIANG, TC .
PHYSICAL REVIEW LETTERS, 1993, 71 (18) :2955-2958
[2]   EXTENDED PHOTOEMISSION FINE-STRUCTURE ANALYSIS OF THE SI(111)-(7X7) SURFACE CORE LEVELS - REPLY [J].
CARLISLE, JA ;
MILLER, T ;
CHIANG, TC .
PHYSICAL REVIEW LETTERS, 1994, 72 (23) :3741-3741
[3]  
GUO JH, 1995, REV SCI INSTRUMENT 2, V66
[4]  
HEIMANN P, 1995, REV SCI INSTURMENT 2, V66, P2160
[6]   PHOTOELECTRON SPECTROMETRY OF THE ACTINIDES FROM AC TO ES [J].
KRAUSE, MO ;
HAIRE, RG ;
KESKIRAHKONEN, O ;
PETERSON, JR .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1988, 47 :215-226
[7]   CORE-LEVEL SPECTROSCOPY OF THE CLEAN SI(001) SURFACE - CHARGE-TRANSFER WITHIN ASYMMETRIC DIMERS OF THE 2X1 AND C(4X2) RECONSTRUCTIONS [J].
LANDEMARK, E ;
KARLSSON, CJ ;
CHAO, YC ;
UHRBERG, RIG .
PHYSICAL REVIEW LETTERS, 1992, 69 (10) :1588-1591
[8]   EXTENDED PHOTOEMISSION FINE-STRUCTURE ANALYSIS OF THE SI(111)-(7X7) SURFACE CORE LEVELS - COMMENT [J].
LELAY, G ;
FONTAINE, M .
PHYSICAL REVIEW LETTERS, 1994, 72 (23) :3740-3740
[9]   DIMER CHARGE ASYMMETRY DETERMINED BY PHOTOEMISSION FROM EPITAXIAL GE ON SI(100)-(2X1) [J].
LIN, DS ;
MILLER, T ;
CHIANG, TC .
PHYSICAL REVIEW LETTERS, 1991, 67 (16) :2187-2190
[10]   DIMER CHARGE ASYMMETRY DETERMINED BY PHOTOEMISSION FROM EPITAXIAL GE ON SI(100)-(2 X-1) - REPLY [J].
LIN, DS ;
CARLISLE, JA ;
MILLER, T ;
CHIANG, TC .
PHYSICAL REVIEW LETTERS, 1992, 69 (03) :552-553