LOW-ABSORPTION MEASUREMENT OF OPTICAL THIN-FILMS USING THE PHOTOTHERMAL SURFACE-DEFORMATION TECHNIQUE

被引：13

作者：

WELSCH, E

WALTHER, HG

ECKARDT, P

LAN, T

机构：

来源：

CANADIAN JOURNAL OF PHYSICS | 1988年 / 66卷 / 07期

关键词：

D O I：

10.1139/p88-106

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：638 / 644

页数：7

共 17 条

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[13]

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[14] CALCULATION AND MEASUREMENT OF THE ABSORPTION IN MULTILAYER FILMS BY MEANS OF PHOTOACOUSTICS [J].

WALTHER, HG ;

WELSCH, E ;

OPFERMANN, J .

THIN SOLID FILMS, 1986, 142 (01) :27-35

[15] LOCALIZATION OF ABSORPTION LOSSES IN OXIDE SINGLE-LAYER FILMS [J].

WELSCH, E ;

WALTHER, HG ;

KUHN, HJ .

JOURNAL DE PHYSIQUE, 1987, 48 (03) :419-424

[16] MEASUREMENT OF THE EXTINCTION OF SPUTTERED TIO2 FILMS [J].

WELSCH, E ;

LIEDER, G ;

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HACKER, E .

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[17]

WELSCH E, 1987, THIN SOLID FILMS, V156, P1

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