LOCALIZATION OF ABSORPTION LOSSES IN OXIDE SINGLE-LAYER FILMS

Absorption measurements performed by means of photoacoustic absorption (PAA)-technique in wedge-shaped TiO//2, Ta//2O//5, and ZrO//2 single-layer films at lambda equals 488 nm, 515 nm, and 647 nm permit a separate determination of bulk and interface absorption, respectively. For TiO//2 and Ta//2O//5 films investigated the film-substrate interface absorption A//f//s dominates over the air-film interface absorption A//a//f, whereas for evaporated ZrO//2 films both the interface contributions are nearly the same. In addition, preliminary results concerned with the wavelength dependence of the absorption of the films investigated are presented.