共 18 条
- [3] BARD AJ, 1980, J AM CHEM SOC, V102, P3670
- [4] ELECTROREFLECTANCE AT A SEMICONDUCTOR-ELECTROLYTE INTERFACE [J]. PHYSICAL REVIEW, 1967, 154 (03): : 696 - +
- [8] DETERMINATION OF MOS FLATBAND CONDITION BY ELECTROREFLECTANCE AND CAPACITANCE MEASUREMENTS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 21 (02): : 469 - 478
- [9] LYDEN JK, 1981, B AM PHYS SOC, V26, P282
- [10] LYDEN JK, PHYS REV LETT