X-RAY FOCUSING USING CYLINDRICAL-CHANNEL CAPILLARY ARRAYS .2. EXPERIMENTS

被引：14

作者：

CHAPMAN, HN

RODE, A

NUGENT, KA

WILKINS, SW

机构：

[1] UNIV MELBOURNE, SCH PHYS, PARKVILLE, VIC 3052, AUSTRALIA

[2] AUSTRALIAN NATL UNIV, RES SCH PHYS SCI, CTR LASER PHYS, CANBERRA, ACT 2601, AUSTRALIA

[3] CSIRO, DIV MAT SCI & TECHNOL, CLAYTON, VIC 3168, AUSTRALIA

来源：

APPLIED OPTICS | 1993年 / 32卷 / 31期

关键词：

X-RAY FOCUSING; MICROCHANNEL PLATES;

D O I：

10.1364/AO.32.006333

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A microchannel plate (MCP) detector blank has been used to focus x rays of 0.154-, 0.62-, and 0.84-nm wavelength generated by a microfocus x-ray tube and a laser-produced plasma. The focusing effect of MCP's arises from total external reflection of x rays at the interior channel surfaces. Measurements of the intensity profiles of the images formed by the MCP have been made and compared with the predictions of a detailed model developed in Part I. [Appl. Opt. 32,6316 (1993)]. It was found that the model gives a reliable description of the data. A consistent set of parameters was found from fits to the data at all three wavelengths.

引用

页码：6333 / 6340

页数：8

共 15 条

[1]

Belyaev L. M., 1976, Soviet Journal of Quantum Electronics, V6, P1121, DOI 10.1070/QE1976v006n09ABEH011855

[2]

Chapman H N, 1990, J Xray Sci Technol, V2, P117, DOI 10.3233/XST-1990-2203

[3]

CHAPMAN HN, 1993, APPL OPT, V32

[4] SURFACE CORRELATION-FUNCTION ANALYSIS OF HIGH-RESOLUTION SCATTERING DATA FROM MIRRORED SURFACES OBTAINED USING A TRIPLE-AXIS X-RAY DIFFRACTOMETER [J].