X-RAY-MICROANALYSIS WITH ENERGY TUNABLE SYNCHROTRON X-RAYS

被引：25

作者：

HAYAKAWA, S

GOHSHI, Y

IIDA, A

AOKI, S

ISHIKAWA, M

机构：

[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 30032,JAPAN

[2] UNIV TSUKUBA,INST APPL PHYS,SAKURA,IBARAKI 30031,JAPAN

[3] NATL INST RADIOL SCI,NAKAMINATO,IBARAKI,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 49卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90308-H

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Focused intense monochromatic synchrotron radiation was realized with a combination of a Pt coated ellipsoidal mirror, a double crystal monochromator and a pinhole. Energy tunable X-ray microanalysis using a focused X-ray beam was compared to particle induced X-ray emission analysis. A section of Japanese cedar showed severe damage after proton irradiation, while another section of the tree showed no damage after the measurement of its trace element distribution by synchrotron radiation. Less damage, high sensitivity and energy tunability were demonstrated by utilizing synchrotron radiation. © 1990.

引用

页码：555 / 560

页数：6

共 12 条

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