AN OLIGOSILANE BRIDGE MODEL FOR THE ORIGIN OF THE INTENSE VISIBLE PHOTOLUMINESCENCE OF POROUS SILICON

被引:41
作者
TAKEDA, Y
HYODO, S
SUZUKI, N
MOTOHIRO, T
HIOKI, T
NODA, S
机构
[1] Toyota Central Research and Development Laboratories, Inc., Aichi-gun, Aichi-ken, 480-11, Nagakute-cho
关键词
D O I
10.1063/1.353182
中图分类号
O59 [应用物理学];
学科分类号
摘要
Oligosilanes bridging microgaps between silicon microcrystallites were investigated as a possible model for the origin of the intense visible photoluminescence of porous silicon by means of the semiempirical molecular-orbital method. The incomplete structural relaxation of the oligosilane bridge after the photoexcitation was found to be a key factor to give the visible photoluminescence. The calculated structure-insensitive photoexcitation energy around 3.3 eV and the structure-sensitive light emission energy around 1.2-2.1 eV are consistent with the experimental evidence. The sufficient transition probabilities between the concerning electronic states support the high efficiency of photoluminescence. Durability of the structure under the photoexcitation was also suggested. The model is valid even if the silicon microcrystallites are partly or thoroughly replaced by silicon oxides particles as is more realistic for the porous silicon exposed to the air.
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页码:1924 / 1928
页数:5
相关论文
共 27 条
[1]   MOLECULAR-ORBITAL THEORY FOR EXCITED-STATES OF TRANSITION-METAL COMPLEXES [J].
ARMSTRONG, DR ;
PERKINS, PG ;
STEWART, JJP ;
FORTUNE, R .
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II, 1972, 68 (11) :1839-+
[3]   SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].
CANHAM, LT .
APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048
[4]   PREFERENTIAL PROPAGATION OF PORES DURING THE FORMATION OF POROUS SILICON - A TRANSMISSION ELECTRON-MICROSCOPY STUDY [J].
CHUANG, SF ;
COLLINS, SD ;
SMITH, RL .
APPLIED PHYSICS LETTERS, 1989, 55 (07) :675-677
[5]   MICROSTRUCTURE OF VISIBLY LUMINESCENT POROUS SILICON [J].
COLE, MW ;
HARVEY, JF ;
LUX, RA ;
ECKART, DW ;
TSU, R .
APPLIED PHYSICS LETTERS, 1992, 60 (22) :2800-2802
[6]   GROUND-STATES OF MOLECULES .38. MNDO METHOD - APPROXIMATIONS AND PARAMETERS [J].
DEWAR, MJS ;
THIEL, W .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1977, 99 (15) :4899-4907
[7]   ELECTROLUMINESCENCE IN THE VISIBLE RANGE DURING ANODIC-OXIDATION OF POROUS SILICON FILMS [J].
HALIMAOUI, A ;
OULES, C ;
BOMCHIL, G ;
BSIESY, A ;
GASPARD, F ;
HERINO, R ;
LIGEON, M ;
MULLER, F .
APPLIED PHYSICS LETTERS, 1991, 59 (03) :304-306
[8]   SPONTANEOUS INCLUSION OF OXYGEN IN SPUTTER-DEPOSITED AMORPHOUS-SILICON DURING AND AFTER FABRICATION [J].
IMURA, T ;
USHITA, K ;
HIRAKI, A .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (02) :L65-L68
[9]  
ITO T, 1988, STRUCTURE SURFACES, V2, P378
[10]   PHOTOLUMINESCENCE OF ORGANO-POLYSILANE [J].
KAGAWA, T ;
FUJINO, M ;
TAKEDA, K ;
MATSUMOTO, N .
SOLID STATE COMMUNICATIONS, 1986, 57 (08) :635-637