ABSOLUTE MEASUREMENT OF LATTICE SPACING D(220) SILICON CRYSTAL IN FLOATING-ZONE

被引：16

作者：

FUJIMOTO, H

NAKAYAMA, K

TANAKA, M

MISAWA, G

机构：

[1] National Research Laboratory of Metrology, Ibaraki, 305

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1995年 / 34卷 / 9A期

关键词：

AVOGADRO CONSTANT; LATTICE SPACING; FUNDAMENTAL CONSTANT; X-RAY INTERFEROMETER;

D O I：

10.1143/JJAP.34.5065

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The lattice spacing d(220) of a silicon crystal of National Research Laboratory of Metrology has been measured with a new combined X-ray and optical interferometer, with relative uncertainty of 0.16 ppm. This value is in good agreement with other reported values, whereas the ratio of molar mass M to density rho measured for this crystal shows discrepancy of around 3 ppm from previously reported ratios. It seems that the conventional route to determining the Avogradro constant from M, rho and d(220) Will require a new characterization technique to estimate the number of silicon atoms in a unit cell volume.

引用

页码：5065 / 5069

页数：5

共 18 条

[1] SIMPLE BRAGG-SPACING COMPARATOR [J].

ANDO, M ;

BAILEY, D ;

HART, M .

ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (JUL) :484-489

[2] A NEW DETERMINATION OF N-A [J].

BASILE, G ;

BECKER, P ;

BERGAMIN, A ;

BETTIN, H ;

CAVAGNERO, G ;

DEBIEVRE, P ;

KUTGENS, U ;

MANA, G ;

MOSCA, M ;

PAJOT, B ;

PANCIERA, R ;

PASIN, W ;

PETTORRUSO, S ;

PEUTO, A ;

SACCONI, A ;

STUMPEL, J ;

VALKIERS, S ;

VITTONE, E ;

ZOSI, G .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :538-541

[3]

BASSILE G, 1994, PHYS REV LETT, V72, P3133

[4] ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL [J].

BECKER, P ;

DORENWENDT, K ;

EBELING, G ;

LAUER, R ;

LUCAS, W ;

PROBST, R ;

RADEMACHER, HJ ;

REIM, G ;

SEYFRIED, P ;

SIEGERT, H .

PHYSICAL REVIEW LETTERS, 1981, 46 (23) :1540-1543

[5] PRINCIPLES AND DESIGN OF LAUE-CASE X-RAY INTERFEROMETERS [J].

BONSE, U ;

HART, M .

ZEITSCHRIFT FUR PHYSIK, 1965, 188 (02) :154-&

[6]

De Bievre P., 1994, 1994 Conference on Precision Electromagnetic Measurements Digest (Cat. No.94CH3449-6), P343, DOI 10.1109/CPEM.1994.333368

[7] A MORE ACCURATE VALUE FOR THE AVOGADRO CONSTANT [J].

DEBIEVRE, P ;

VALKIERS, S ;

PEISER, S ;

BECKER, P ;

LUDICKE, F ;

SPIEWECK, F ;

STUMPEL, J .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :530-532

[8] X-RAY TO VISIBLE WAVELENGTH RATIOS [J].

DESLATTES, RD ;

HENINS, A .

PHYSICAL REVIEW LETTERS, 1973, 31 (16) :972-975

[9] AVOGADRO CONSTANT - CORRECTIONS TO AN EARLIER REPORT [J].

DESLATTES, RD ;

HENINS, A ;

SCHOONOVER, RM ;

CARROLL, CL ;

BOWMAN, HA .

PHYSICAL REVIEW LETTERS, 1976, 36 (15) :898-900

[10] DETERMINATION OF AVOGADRO CONSTANT [J].

DESLATTES, RD ;

HENINS, A ;

BOWMAN, HA ;

SCHOONOVER, RM ;

CARROLL, CL ;

BARNES, IL ;

MACHLAN, LA ;

MOORE, LJ ;

SHIELDS, WR .

PHYSICAL REVIEW LETTERS, 1974, 33 (08) :463-466

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