HIGH-RESOLUTION ENERGY-LOSS SPECTROSCOPY

被引：10

作者：

BATSON, PE

机构：

来源：

ULTRAMICROSCOPY | 1989年 / 28卷 / 1-4期

关键词：

D O I：

10.1016/0304-3991(89)90265-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：32 / 39

页数：8

共 16 条

[1] FORBIDDEN-REFLECTION LATTICE IMAGING FOR THE DETERMINATION OF KINK DENSITIES ON PARTIAL DISLOCATIONS [J].

ALEXANDER, H ;

SPENCE, JCH ;

SHINDO, D ;

GOTTSCHALK, H ;

LONG, N .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1986, 53 (05) :627-643

[2] HIGH-ENERGY RESOLUTION ELECTRON SPECTROMETER FOR 1-NM SPATIAL-ANALYSIS [J].

BATSON, PE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (01) :43-48

[3] PARALLEL DETECTION FOR HIGH-RESOLUTION ELECTRON-ENERGY LOSS STUDIES IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].

BATSON, PE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (07) :1132-1138

[4] THE IBM COMPUTER - STEM SYSTEM [J].

BATSON, PE ;

TRAFAS, G .

ULTRAMICROSCOPY, 1982, 8 (03) :293-300

[5] EXTENDED FINE-STRUCTURE ON THE CARBON CORE-IONIZATION EDGE OBTAINED FROM NANOMETER-SIZED AREAS WITH ELECTRON-ENERGY-LOSS SPECTROSCOPY [J].

BATSON, PE ;

CRAVEN, AJ .

PHYSICAL REVIEW LETTERS, 1979, 42 (14) :893-897

[6] LOCAL BONDING AND ELECTRONIC-STRUCTURE OBTAINED FROM ELECTRON-ENERGY LOSS SCATTERING [J].

BATSON, PE ;

KAVANAGH, KL ;

WONG, CY ;

WOODALL, JM .

ULTRAMICROSCOPY, 1987, 22 (1-4) :89-101

[7]

BATSON PE, 1987, SCANNING MICROSCOP S, V1, P189

[8]

BATSON PE, 1987, 45TH P ANN EMSA M BA, P132

[9] ORIENTATION-DEPENDENT EXTENDED FINE-STRUCTURE IN ELECTRON-ENERGY-LOSS SPECTRA [J].

DISKO, MM ;

KRIVANEK, OL ;

REZ, P .

PHYSICAL REVIEW B, 1982, 25 (06) :4252-4255

[10] CARBON-K EDGE IN GRAPHITE MEASURED USING ELECTRON-ENERGY-LOSS SPECTROSCOPY [J].

KINCAID, BM ;

MEIXNER, AE ;

PLATZMAN, PM .

PHYSICAL REVIEW LETTERS, 1978, 40 (19) :1296-1299

← 1 2 →