FLAT BAND STATE DETERMINATION OF MIS AND SCHOTTKY INTERFACES BY MODULATED PHOTO-LUMINESCENCE METHOD

被引:6
作者
ANDO, K
YAMAGUCHI, M
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10.1143/JJAP.20.1335
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O59 [应用物理学];
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页码:1335 / 1336
页数:2
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[2]  
ANDO K, 1981, JPN J APPL PHYS, V20
[3]   INVESTIGATION OF THERMALLY OXIDISED SILICON SURFACES USING METAL-OXIDE-SEMICONDUCTOR STRUCTURES [J].
GROVE, AS ;
DEAL, BE ;
SNOW, EH ;
SAH, CT .
SOLID-STATE ELECTRONICS, 1965, 8 (02) :145-+