GRAZING-INCIDENCE MOSSBAUER-SPECTROSCOPY - NEW METHOD FOR SURFACE-LAYERS ANALYSIS .1. INSTRUMENTATION

被引：37

作者：

IRKAEV, SM

ANDREEVA, MA

SEMENOV, VG

BELOZERSKII, GN

GRISHIN, OV

机构：

[1] MOSCOW MV LOMONOSOV STATE UNIV,DEPT PHYS,MOSCOW 117234,RUSSIA

[2] ST PETERSBURG STATE UNIV,DEPT GEOG,ST PETERSBURG 199164,RUSSIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 74卷 / 04期

关键词：

D O I：

10.1016/0168-583X(93)95954-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The aims of this series of papers are to describe a spectrometer for simultaneous investigation of Mossbauer spectra from: (1) specularly reflected gamma-rays, (2) secondary electron, (3) characteristic X-ray, and (4) scattered gamma-rays (part I); to present a general theory of such spectra and to indicate some unusual characteristics and features of Mossbauer spectra at grazing angles (part II); and to give a quantitative analysis of experimental spectra for some Fe-57 films which shows that grazing incidence mossbauer spectroscopy (GIMS) is really a new method of surface investigation (part III).

引用

页码：545 / 553

页数：9

共 14 条

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