共 38 条
[1]
ALTARELLI M, 1977, 5 P INT C VAC UV RAD, pC4
[2]
THERMOREFLECTANCE AND TEMPERATURE-DEPENDENCE OF L2,3 SOFT-X-RAY THRESHOLD IN SI
[J].
PHYSICAL REVIEW B,
1977, 16 (12)
:5436-5442
[4]
ELECTROREFLECTANCE OF GAAS AND GAP TO 27 EV USING SYNCHROTRON RADIATION
[J].
PHYSICAL REVIEW B,
1975, 12 (06)
:2527-2538
[5]
ASPNES DE, 1976, 13TH P INT C PHYS SE, P1000
[6]
BASSANI F, 1979, I PHYS C SER, V43, P1355
[7]
SOFT-X-RAY ELECTROREFLECTANCE - FINAL-STATE EFFECTS ON SI(2P) OPTICAL-TRANSITIONS
[J].
NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA B-GENERAL PHYSICS RELATIVITY ASTRONOMY AND MATHEMATICAL PHYSICS AND METHODS,
1977, 39 (02)
:409-416
[8]
IONICITY EFFECTS ON COMPOUND SEMICONDUCTOR (110) SURFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1977, 14 (04)
:899-903
[9]
ELECTRONIC POLARIZATION (RELAXATION) EFFECTS IN THE CORE LEVEL SPECTRA OF SEMICONDUCTORS .1. GENERAL-THEORY OF ELECTRONIC POLARIZATION (RELAXATION) IN SEMICONDUCTORS
[J].
PHYSICA STATUS SOLIDI B-BASIC RESEARCH,
1979, 94 (01)
:239-248
[10]
ELECTRONIC POLARIZATION (RELAXATION) EFFECTS IN THE CORE LEVEL SPECTRA OF SEMICONDUCTORS .2. APPLICATION TO GA3D AND SI2P LEVELS
[J].
PHYSICA STATUS SOLIDI B-BASIC RESEARCH,
1979, 95 (01)
:185-194