THERMOREFLECTANCE AND TEMPERATURE-DEPENDENCE OF L2,3 SOFT-X-RAY THRESHOLD IN SI

被引：7

作者：

ASPNES, DE

BAUER, RS

BACHRACH, RZ

MCMENAMIN, JC

机构：

[1] MAX PLANCK INST FESTKORPERFORSCH,D-7000 STUTTGART 80,FED REP GER

[2] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

PHYSICAL REVIEW B | 1977年 / 16卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.16.5436

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5436 / 5442

页数：7

共 43 条

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