CALIBRATION METHODS FOR ION PROBE DETERMINATION OF FLUORINE IN MINERALIZED TISSUE

[1] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438

[2] Castaing R., 1962, J MICROSCOPIE, V1, P395

[3] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[4] JACKSON CK, 1975, COMMUNICATION APR

[5] KOCH G, 1972, Odontologisk Revy, V23, P437

[6] ION PROBE TECHNIQUE FOR STUDY OF GALLIUM DIFFUSION IN SILICON-NITRIDE FILMS [J]. THIN SOLID FILMS, 1975, 25 (02) : 491 - 500

[7] LODDING A, 1974, Z NATURFORSCH A, VA 29, P897, DOI 10.1515/zna-1974-0610

[8] PETERSSON LG, 1974, Z NATURFORSCH C, VC 29, P417

[9] RUBEROL JM, 1968, 5TH P INT C XRAY OPT

[10] 1974, TD1000 TECHN NOT

[1] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438

[2] Castaing R., 1962, J MICROSCOPIE, V1, P395

[3] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[4] JACKSON CK, 1975, COMMUNICATION APR

[5] KOCH G, 1972, Odontologisk Revy, V23, P437

[6] ION PROBE TECHNIQUE FOR STUDY OF GALLIUM DIFFUSION IN SILICON-NITRIDE FILMS [J]. THIN SOLID FILMS, 1975, 25 (02) : 491 - 500

[7] LODDING A, 1974, Z NATURFORSCH A, VA 29, P897, DOI 10.1515/zna-1974-0610

[8] PETERSSON LG, 1974, Z NATURFORSCH C, VC 29, P417

[9] RUBEROL JM, 1968, 5TH P INT C XRAY OPT

[10] 1974, TD1000 TECHN NOT