EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - A MODERN STRUCTURAL TOOL IN MATERIALS SCIENCE

被引：28

作者：

WONG, J

机构：

[1] GE, Schenectady, NY, USA, GE, Schenectady, NY, USA

来源：

MATERIALS SCIENCE AND ENGINEERING | 1986年 / 80卷 / 02期

关键词：

MATERIALS SCIENCE - X-RAYS - Absorption;

D O I：

10.1016/0025-5416(86)90191-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The extended X-ray absorption fine structure (EXAFS) technique has now been established to be a very powerful and sometimes unique way of probing the local atomic structure of all forms of matter, particularly since the availability of highly intense synchrotron radiation in the X-ray region. In this review the physical mechanism associated with the EXAFS phenomenon is presented in the light of the single-scattering formalism. The use of synchrotron radiation as a light source for EXAFS phenomenon is presented in the light of the single-scattering formalism. The use of synchrotron radiation as a light source for EXAFS experiments and the use of data analysis to extract quantitative structural information are discussed by way of examples.

引用

页码：107 / 128

页数：22