STATIC SECONDARY ION MASS-SPECTROSCOPY (SSIMS) ANALYSIS OF MICA SURFACE

被引：14

作者：

DOWSETT, MG

KING, RM

PARKER, EHC

机构：

来源：

SURFACE SCIENCE | 1978年 / 71卷 / 03期

关键词：

D O I：

10.1016/0039-6028(78)90445-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：541 / 547

页数：7

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