CHARACTERIZATION OF SOLIDS AND SURFACES USING ION-BEAMS AND MASS-SPECTROMETRY

被引：23

作者：

WINOGRAD, N ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT CHEM,UNIVERSITY PK,PA 16802

来源：

PROGRESS IN SOLID STATE CHEMISTRY | 1981年 / 13卷 / 04期

关键词：

D O I：

10.1016/0079-6786(81)90001-7

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

引用

页码：285 / 375

页数：91

共 196 条

[71]

HARRISON DE, 1980, SPRINGER SERIES CHEM, V9, P12

[72]

HAYES DM, 1981, SURF SCI, V105, P225

[73] INVESTIGATION OF OXIDATION OF POLYCRYSTALLINE LEAD BY XPS AND SIMS [J].

HEWITT, RW ;

WINOGRAD, N .

SURFACE SCIENCE, 1978, 78 (01) :1-14

[74] AZIMUTHAL ANISOTROPIES OF DIMER IONS EJECTED FROM ION BOMBARDED NI(001) [J].

HOLLAND, SP ;

GARRISON, BJ ;

WINOGRAD, N .

PHYSICAL REVIEW LETTERS, 1980, 44 (11) :756-759

[75] SURFACE-STRUCTURE FROM ANGLE-RESOLVED SECONDARY-ION MASS-SPECTROMETRY - OXYGEN ON CU(001) [J].

HOLLAND, SP ;

GARRISON, BJ ;

WINOGRAD, N .

PHYSICAL REVIEW LETTERS, 1979, 43 (03) :220-223

[76] SIMS STUDY OF MECHANISM OF CLUSTER FORMATION DURING ION-BOMBARDMENT OF ALKALI-HALIDES [J].

HONDA, F ;

LANCASTER, GM ;

FUKUDA, Y ;

RABALAIS, JW .

JOURNAL OF CHEMICAL PHYSICS, 1978, 69 (11) :4931-4937

[77] CLUSTERING DISTANCES CRITICAL TO METAL DIMER FORMATION IN THE SECONDARY ION MASS-SPECTRA (SIMS) OF CESIUM-CHLORIDE [J].

HONDA, F ;

FUKUDA, Y ;

RABALAIS, JW .

JOURNAL OF CHEMICAL PHYSICS, 1979, 70 (11) :4834-4836

[78]

HONIG R, 1963, ADV MASS SPECTROM, V2, P25

[79] SPUTTERING OF SURFACES BY POSITIVE ION BEAMS OF LOW ENERGY [J].

HONIG, RE .

JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) :549-555

[80] USE OF SIMS FOR STUDIES OF ADSORPTION ON WELL-DEFINED METAL-SURFACES (1) COMBINED XPS-LEED-SIMS STUDIES OF O2, CO, H2O, AND H-2 ON NI (100) [J].

HOPSTER, H ;

BRUNDLE, CR .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :548-551

← 3 4 5 6 7 8 9 10 11 12 →