FILM THICKNESS BY X-RAY EMISSION SPECTROGRAPHY

被引：38

作者：

LIEBHAFSKY, HA

ZEMANY, PD

机构：

来源：

ANALYTICAL CHEMISTRY | 1956年 / 28卷 / 04期

关键词：

D O I：

10.1021/ac50161a013

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：455 / 459

页数：5

共 11 条

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[6] PRECISION IN X-RAY EMISSION SPECTROGRAPHY [J].

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PFEIFFER, HG ;

ZEMANY, PD .

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ZEMANY, PD .

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[9] CHEMICAL ANALYSIS OF THIN FILMS BY X-RAY EMISSION SPECTROGRAPHY [J].

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[10]

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