X-RAY CRYSTAL TRUNCATION ROD SCATTERING - GENERAL INTENSITY FORMULA FOR NO LATERAL DISPLACEMENTS OF SURFACE ATOMS

被引：4

作者：

KASHIHARA, Y

机构：

[1] Department of Applied Physics, Nagoya University, 464, Chikusa-ku Nagoya

来源：

SURFACE SCIENCE | 1990年 / 232卷 / 03期

关键词：

D O I：

10.1016/0039-6028(90)90135-U

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We present a fundamental formula to analyze the X-ray intensity distributions along the crystal truncation rod (CTR) scattered from the surface of a crystal. By introducing the model functions for the surface roughness and the lattice distortion near the surface, we provide general analytical methods for determining the surface structure from the CTR scattering. These methods can be used for the investigation of intensity profiles of the CTR scattering observed around any Bragg point. © 1990.

引用

页码：417 / 425

页数：9

共 11 条

[1] SCATTERING OF X-RAYS FROM CRYSTAL-SURFACES [J].

ANDREWS, SR ;

COWLEY, RA .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (35) :6427-6439

[2]

De Fontaine D., 1979, SOLID STATE PHYS, V34, P73

[3] NUMBER OF INDEPENDENT PAIR-CORRELATION FUNCTIONS IN MULTICOMPONENT SYSTEMS [J].

DEFONTAINE, D .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (FEB1) :15-+

[4] ATOMIC DISPLACEMENTS AT SURFACE OF SI-WAFER(111) [J].

KASHIHARA, Y ;

KAWAMURA, K ;

KASHIWAGURA, N ;

HARADA, J .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1987, 26 (06) :L1029-L1031

[5] X-RAY MEASUREMENTS OF THE CRYSTAL TRUNCATION ROD SCATTERING FROM CLEAVAGE SURFACES OF IONIC-CRYSTALS [J].

KASHIHARA, Y ;

KIMURA, S ;

HARADA, J .

SURFACE SCIENCE, 1989, 214 (03) :477-492

[6]

KASHIHARA Y, IN PRESS SURF SCI

[7] DIFFRACTION FROM STEPPED SURFACES .1. REVERSIBLE SURFACES [J].

LENT, CS ;

COHEN, PI .

SURFACE SCIENCE, 1984, 139 (01) :121-154

[8] DIFFRACTION FROM SURFACES WITH RANDOMLY DISTRIBUTED STEPS [J].

LU, TM ;

LAGALLY, MG .

SURFACE SCIENCE, 1982, 120 (01) :47-66

[9] CRYSTAL TRUNCATION RODS AND SURFACE-ROUGHNESS [J].

ROBINSON, IK .

PHYSICAL REVIEW B, 1986, 33 (06) :3830-3836

[10] X-RAY-DIFFRACTION FROM ROUGH, RELAXED AND RECONSTRUCTED SURFACES [J].

VLIEG, E ;

VANDERVEEN, JF ;

GURMAN, SJ ;

NORRIS, C ;

MACDONALD, JE .

SURFACE SCIENCE, 1989, 210 (03) :301-321

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