ACTIVATION-ENERGIES FOR THE DIFFERENT ELECTROMIGRATION MECHANISMS IN ALUMINUM

被引：79

作者：

SCHREIBER, HU

机构：

来源：

SOLID-STATE ELECTRONICS | 1981年 / 24卷 / 06期

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D O I：

10.1016/0038-1101(81)90080-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：583 / &

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