EVALUATION OF SOI SIMOX SUBSTRATES USING PHOTOCONDUCTIVE FREQUENCY RESOLVED SPECTROSCOPY (PCRFS)

被引:2
作者
HOMEWOOD, KP [1 ]
REESON, KJ [1 ]
LOURENCO, MA [1 ]
HEMMENT, PLF [1 ]
DAVIS, JR [1 ]
机构
[1] BRITISH TELECOM RES LABS,MARTLESHAM HEATH,ENGLAND
关键词
D O I
10.1016/0168-583X(89)90772-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:207 / 209
页数:3
相关论文
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[2]   A SIMPLE PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROMETER FOR CARRIER LIFETIME DETERMINATION IN SEMICONDUCTORS [J].
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