ELECTRON DETECTION IN THE ANALYTICAL ELECTRON-MICROSCOPE

被引:16
作者
CHAPMAN, JN
CRAVEN, AJ
SCOTT, CP
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D O I
10.1016/0304-3991(89)90281-7
中图分类号
TH742 [显微镜];
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页码:108 / 117
页数:10
相关论文
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