DEPTH RESOLUTION DEGRADATION OF SPUTTER-PROFILED INP-INXGA1-XASYP1-Y INTERFACES CAUSED BY CONE FORMATION

被引:28
作者
WILLIAMS, RS
NELSON, RJ
SCHLIER, AR
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D O I
10.1063/1.91332
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O59 [应用物理学];
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页码:827 / 829
页数:3
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