COSMETIC DEFECTS IN CCD IMAGERS

被引：16

作者：

JASTRZEBSKI, L ^{[1
]}

LEVINE, PA ^{[1
]}

FISHER, WA ^{[1
]}

COPE, AD ^{[1
]}

SAVOYE, ED ^{[1
]}

HENRY, WN ^{[1
]}

机构：

[1] RCA,DIV OPTOELECTR,LANCASTER,PA 17604

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1981年 / 128卷 / 04期

关键词：

D O I：

10.1149/1.2127526

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：885 / 892

页数：8

共 18 条

[1]

FISHER AW, 1976, J ELECTROCHEM SOC, V123, P434, DOI [10.1149/1.2133091, 10.1149/1.2132845]

[2]

HAYAFUJI Y, 1977, SEMICONDUCTOR SILICO, P750

[3] VIDEO DEFECTS IN CHARGE-COUPLED IMAGE SENSORS [J].

HOKARI, Y ;

SHIRAKI, H .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (04) :585-590

[4] DEFECTS IN SILICON SUBSTRATES [J].

HU, SM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (01) :17-31

[5] MATERIAL LIMITATIONS WHICH CAUSE STRIATIONS IN CCD IMAGERS [J].

JASTRZEBSKI, L ;

LEVINE, PA ;

COPE, AD ;

HENRY, WN ;

BATTSON, DF .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (08) :1694-1701

[6]

JASTRZEBSKI L, UNPUBLISHED

[7]

JASTRZEBSKI L, 1980, MAY EL SOC M ST LOUI

[8]

KOSNOCKY WF, 1974, RCA REV, V35, P2

[9]

LEAMY HJ, 1978, SCANNING ELECTRON MI, V1, P717

[10]

MELEN R, 1977, CHARGE COUPLE DEVICE

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