VIDEO DEFECTS IN CHARGE-COUPLED IMAGE SENSORS

被引：12

作者：

HOKARI, Y ^{[1
]}

SHIRAKI, H ^{[1
]}

机构：

[1] NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1977年 / 16卷 / 04期

关键词：

D O I：

10.1143/JJAP.16.585

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：585 / 590

页数：6

共 7 条

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[2] GETTERING OF METALLIC IMPURITIES FROM PLANAR SILICON DIODES [J].

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ALDRICH, RW .

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[3] OXIDATION-INDUCED STACKING-FAULTS IN SILICON .1. NUCLEATION PHENOMENON [J].

RAVI, KV ;

VARKER, CJ .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (01) :263-271

[4] CHARGE-COUPLED AREA IMAGE SENSOR AND FRAME STORE [J].

SEQUIN, CH ;

SEALER, DA ;

BERTRAM, WJ ;

TOMPSETT, MF ;

BUCKLEY, RR ;

SHANKOFF, TA ;

MCNAMARA, WJ .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (03) :244-252

[5] BRIGHT SPOTS IN IMAGE OF SILICON VIDICON [J].

SHIRAKI, H ;

MATSUI, J ;

KAWAMURA, T ;

HANOAKA, M ;

SASAKI, T .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (02) :213-&

[6]

SIRTL E, 1961, Z METALLKD, V52, P529

[7] 228 BY 248 CELL CHARGE-COUPLED IMAGE SENSOR WITH 2-LEVEL OVERLAPPING POLY-SILICON ELECTRODES [J].

TANIGAWA, H ;

ISHIHARA, Y ;

HOKARI, Y ;

ISHIHARA, T ;

AIZAWA, T ;

SHIRAKI, H .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1976, 15 :241-245

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