TRANSMISSION ELECTRON-MICROSCOPY OF MULTILAYERED METAL AND SEMICONDUCTOR STRUCTURES

被引：6

作者：

OPPOLZER, H

机构：

来源：

JOURNAL DE PHYSIQUE | 1987年 / 48卷 / C-5期

关键词：

D O I：

10.1051/jphyscol:1987510

中图分类号：

学科分类号：

摘要：

引用

页码：65 / 74

页数：10

共 27 条

[1] SUBSTRATE ROTATION-INDUCED COMPOSITIONAL OSCILLATION IN MOLECULAR-BEAM EPITAXY (MBE) [J].

ALAVI, K ;

PETROFF, PM ;

WAGNER, WR ;

CHO, AY .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02) :146-148

[2]

ALAVI K, COMMUNICATION

[3]

BRUGGER H, 1987, J PHYSIQUE, V48

[4] STEM/EDX microanalysis of compositional fluctuations in semiconductor multi-quantum-well structures [J].

Bullock, JF ;

Titchmarsh, JM ;

Humphreys, CJ .

SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1986, 1 (06) :343-345

[5]

DRUMINSKI M, IN PRESS

[6] ELASTIC RELAXATION IN TRANSMISSION ELECTRON-MICROSCOPY OF STRAINED-LAYER SUPERLATTICES [J].

GIBSON, JM ;

HULL, R ;

BEAN, JC ;

TREACY, MMJ .

APPLIED PHYSICS LETTERS, 1985, 46 (07) :649-651

[7]

HETHERINGTON CJD, 1985, MATER RES SOC S P, V37, P41

[8] ELECTRICAL-PROPERTIES OF MULTILAYERED AL/NI AND AL/MO FILMS [J].

HOFFMANN, H ;

KUCHER, P .

THIN SOLID FILMS, 1987, 146 (02) :155-164

[9] INTERMETALLIC COMPOUNDS OF AL AND TRANSITIONS METALS - EFFECT OF ELECTROMIGRATION IN 1-2-MUM-WIDE LINES [J].

HOWARD, JK ;

WHITE, JF ;

HO, PS .

JOURNAL OF APPLIED PHYSICS, 1978, 49 (07) :4083-4093

[10] STRUCTURE IMAGING OF COMMENSURATE GEXSI1-X/SI(100) INTERFACES AND SUPERLATTICES [J].

HULL, R ;

GIBSON, JM ;

BEAN, JC .

APPLIED PHYSICS LETTERS, 1985, 46 (02) :179-181

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