CORRECT SUBSTRATE-TEMPERATURE MONITORING WITH INFRARED OPTICAL-PYROMETER FOR MOLECULAR-BEAM EPITAXY OF III-V SEMICONDUCTORS

被引:32
作者
MIZUTANI, T
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 06期
关键词
D O I
10.1116/1.584428
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1671 / 1677
页数:7
相关论文
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    WRIGHT, SL
    MARKS, RF
    WANG, WI
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (02): : 505 - 506