OBSERVATION AND ANALYSIS OF QUANTUM WIRE STRUCTURES BY HIGH-RESOLUTION X-RAY-DIFFRACTION

被引：29

作者：

TAPFER, L ^{[1
]}

LAROCCA, GC ^{[1
]}

LAGE, H ^{[1
]}

CINGOLANI, R ^{[1
]}

GRAMBOW, P ^{[1
]}

FISCHER, A ^{[1
]}

HEITMANN, D ^{[1
]}

PLOOG, K ^{[1
]}

机构：

[1] MAX PLANCK INST FESTKORPERFORSCH,W-7000 STUTTGART 80,GERMANY

来源：

SURFACE SCIENCE | 1992年 / 267卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(92)91126-V

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We report on the double-crystal X-ray diffraction analysis of AlGaAs/GaAs quantum wire structures. We show that X-ray scattering is very sensitive to the modulation of structural parameters parallel to the crystal surface under certain diffraction conditions. The experimental diffraction patterns exhibit quantum wire satellite peaks which allow us to determine the quantum wire period and the quantum wire width. Furthermore, we found that due to the finite lateral width of the quantum wires a partial asymmetric strain relaxation of the unit cell occurs resulting in an orthorhombic lattice deformation.

引用

页码：227 / 231

页数：5

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