DEEP IMPURITY LEVELS IN INP LEC CRYSTALS

被引:64
作者
YAMAZOE, Y [1 ]
SASAI, Y [1 ]
NISHINO, T [1 ]
HAMAKAWA, Y [1 ]
机构
[1] MATSUSHITA ELECT IND CO LTD,KADOMA,OSAKA 571,JAPAN
关键词
D O I
10.1143/JJAP.20.347
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:347 / 354
页数:8
相关论文
共 23 条
[1]  
BARTHRUFF D, 1979, J ELECTRON MATER, V8, P485, DOI 10.1007/BF02652400
[2]   PHOTOCAPACITANCE EFFECTS OF DEEP TRAPS IN NORMAL-TYPE INP [J].
CHIAO, SH ;
ANTYPAS, GA .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (01) :466-468
[3]   HOLE TRAPS IN N-INP BY DLTS AND TRANSIENT CAPACITANCE TECHNIQUES [J].
CHOUDHURY, ANMM ;
ROBSON, PN .
ELECTRONICS LETTERS, 1979, 15 (09) :247-249
[4]   NONRADIATIVE CAPTURE AND RECOMBINATION BY MULTIPHONON EMISSION IN GAAS AND GAP [J].
HENRY, CH ;
LANG, DV .
PHYSICAL REVIEW B, 1977, 15 (02) :989-1016
[5]   DEEP LEVEL SPECTROSCOPY, LOW-TEMPERATURE DEFECT MOTION AND NONRADIATIVE RECOMBINATION IN GAAS AND GAP [J].
HENRY, CH .
JOURNAL OF ELECTRONIC MATERIALS, 1975, 4 (05) :1037-1052
[6]   LIQUID-PHASE EPITAXY OF INP [J].
HESS, K ;
STATH, N ;
BENZ, KW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (09) :1208-1212
[7]   PHOTO-LUMINESCENCE OF UNDOPED (100) INP HOMOEPITAXIAL FILMS GROWN BY MOLECULAR-BEAM EPITAXY [J].
KAWAMURA, Y ;
IKEDA, M ;
ASAHI, H ;
OKAMOTO, H .
APPLIED PHYSICS LETTERS, 1979, 35 (07) :481-484
[8]   INCREASING EFFECTIVE BARRIER HEIGHT OF SCHOTTKY CONTACTS TO N-INXGA1-XAS [J].
MORGAN, DV ;
FREY, J .
ELECTRONICS LETTERS, 1978, 14 (23) :737-738
[9]  
Mullin J. B., 1972, Journal of Crystal Growth, V13-14, P640, DOI 10.1016/0022-0248(72)90534-9
[10]   OBSERVATION OF DEEP IMPURITY LEVELS IN IN0.85GA0.15AS0.39P0.61 [J].
SASAI, Y ;
YAMAZOE, Y ;
OKUYAMA, M ;
NISHINO, T ;
HAMAKAWA, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (07) :1415-1416