OBSERVATIONS OF RESTRICTED BEAM-INDUCED SPECIMEN MOTION WITH SMALL-SPOT ILLUMINATION

被引：31

作者：

DOWNING, KH

机构：

[1] Lawrence Berkeley Lab, Berkeley, CA,, USA, Lawrence Berkeley Lab, Berkeley, CA, USA

来源：

ULTRAMICROSCOPY | 1988年 / 24卷 / 04期

关键词：

BEAM-INDUCED MOTION - SMALL-SPOT ILLUMINATION - SPECIMEN MOTION;

D O I：

10.1016/0304-3991(88)90129-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：387 / 398

页数：12

相关论文

共 16 条

[1] BAHR GF, 1965, LAB INVEST, V14, P1115
[2] METHODS FOR SPECIMEN THICKNESS DETERMINATION IN ELECTRON-MICROSCOPY .2. CHANGES IN THICKNESS WITH DOSE
BERRIMAN, J
LEONARD, KR
[J]. ULTRAMICROSCOPY, 1986, 19 (04) : 349 - 366
[3] USE OF SPOT-SCAN PROCEDURE FOR RECORDING LOW-DOSE MICROGRAPHS OF BEAM-SENSITIVE SPECIMENS
BULLOUGH, P
HENDERSON, R
[J]. ULTRAMICROSCOPY, 1987, 21 (03) : 223 - 229
[4] THE QUASI-THERMAL MECHANISM FOR ELECTRON-BEAM DAMAGE OF NORMAL-PARAFFINS
DORSET, DL
HOLLAND, FM
FRYER, JR
[J]. ULTRAMICROSCOPY, 1984, 13 (03) : 305 - 310
[5] STRUCTURAL-CHANGES IN ELECTRON-IRRADIATED PARAFFIN CRYSTALS AT LESS-THAN 15-K AND THEIR RELEVANCE TO LATTICE IMAGING EXPERIMENTS
DORSET, DL
ZEMLIN, F
[J]. ULTRAMICROSCOPY, 1985, 17 (03) : 229 - 235
[6] IMPROVEMENT IN HIGH-RESOLUTION IMAGE QUALITY OF RADIATION-SENSITIVE SPECIMENS ACHIEVED WITH REDUCED SPOT SIZE OF THE ELECTRON-BEAM
DOWNING, KH
GLAESER, RM
[J]. ULTRAMICROSCOPY, 1986, 20 (03) : 269 - 278
[7] DOWNING KH, 1987, 45TH P ANN EMSA M BA, P6
[8] DOWNING KH, 1986, 44TH P ANN M EL MICR, P14
[9] HIGH-RESOLUTION COLD STAGE FOR THE JEOL 100B AND 100C ELECTRON-MICROSCOPES
HAYWARD, SB
GLAESER, RM
[J]. ULTRAMICROSCOPY, 1980, 5 (01) : 3 - 8
[10] STRUCTURE OF PURPLE MEMBRANE FROM HALOBACTERIUM-HALOBIUM - RECORDING, MEASUREMENT AND EVALUATION OF ELECTRON-MICROGRAPHS AT 3.5 A RESOLUTION
HENDERSON, R
BALDWIN, JM
DOWNING, KH
LEPAULT, J
ZEMLIN, F
[J]. ULTRAMICROSCOPY, 1986, 19 (02) : 147 - 178