FLICKER NOISE IN METAL SEMICONDUCTOR SCHOTTKY BARRIER DIODES DUE TO MULTISTEP TUNNELING PROCESSES

被引：63

作者：

HSU, ST

机构：

来源：

关键词：

D O I：

10.1109/T-ED.1971.17300

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：882 / &

共 21 条

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