VALIDITY OF BRAGGS RULE IN SPUTTERED SUPERCONDUCTING NBN AND NBC FILMS OF VARIOUS COMPOSITIONS

被引:16
作者
MEYER, O [1 ]
LINKER, G [1 ]
KRAEFT, B [1 ]
机构
[1] KERN FORSCH ZENTRUM,INST ANGEWANDTE KERN PHYS,KARLSRUHE,WEST GERMANY
关键词
D O I
10.1016/0040-6090(73)90057-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:217 / 226
页数:10
相关论文
共 12 条
[1]   DRUCKSYNTHESE VON NIOBNITRIDEN UND KONSTITUTION VON DELTA-NBN [J].
BRAUER, G ;
KIRNER, H .
ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 1964, 328 (1-2) :34-43
[2]  
CHU WK, 1969, PHYS REV, V187, P187
[3]   PREPARATION AND SUPERCONDUCTING PROPERTIES OF THIN FILMS OF TRANSITION METAL INTERSTITIAL COMPOUNDS [J].
GAVALER, JR ;
HULM, JK ;
JANOCKO, MA ;
JONES, CK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (01) :177-&
[4]  
Geballe T.H., 1966, PHYSICS, V2, P293
[5]   PREPARATION AND SUPERCONDUCTIVE PROPERTIES OF NIOBIUM NITRIDE AND NIOBIUM NITRIDE WITH ADMIXTURES OF TITANIUM ZIRCONIUM AND TANTALUM [J].
HORN, G ;
SAUR, E .
ZEITSCHRIFT FUR PHYSIK, 1968, 210 (01) :70-&
[6]  
HULM JK, 1970, 12 P INT C LOW TEMP, P325
[7]   BACKSCATTERING ENERGY-LOSS PARAMETER MEASUREMENTS IN THIN METAL-FILMS [J].
LINKER, G ;
MEYER, O ;
GETTINGS, M .
THIN SOLID FILMS, 1973, 19 (02) :177-185
[8]   ANALYSIS OF AMORPHOUS LAYERS ON SILICON BY BACKSCATTERING AND CHANNELING EFFECT MEASUREMENTS [J].
MEYER, O ;
GYULAI, J ;
MAYER, JW .
SURFACE SCIENCE, 1970, 22 (02) :263-&
[9]   MICROANALYSIS OF MATERIALS BY BACKSCATTERING SPECTROMETRY [J].
NICOLET, MA ;
MITCHELL, IV ;
MAYER, JW .
SCIENCE, 1972, 177 (4052) :841-&
[10]  
SAITO Y, 1970, 12TH P C LOW TEMP PH, P329