SI(LI) SEMICONDUCTOR DETECTOR IN ANGLE AND ENERGY DISPERSIVE-X-RAY DIFFRACTOMETRY

被引：20

作者：

LAINE, E ^{[1
]}

LAHTEENMAKI, I ^{[1
]}

HAMALAIN.M ^{[1
]}

机构：

[1] UNIV TURKU, DEPT PHYS 2, TURKU, FINLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1974年 / 7卷 / 11期

关键词：

D O I：

10.1088/0022-3735/7/11/026

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：951 / 954

页数：4

共 21 条

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