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ELLIPSOMETRIC STUDIES OF CHEMISORPTION ON GAP(110) SINGLE-CRYSTALS
被引:30
作者
:
MORGAN, AE
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
MORGAN, AE
[
1
]
机构
:
[1]
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
来源
:
SURFACE SCIENCE
|
1974年
/ 43卷
/ 01期
关键词
:
D O I
:
10.1016/0039-6028(74)90225-8
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:150 / 172
页数:23
相关论文
共 39 条
[1]
MEASUREMENT OF OXYGEN ADSORPTION ON SILICON BYELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
GOBELI, GW
论文数:
0
引用数:
0
h-index:
0
GOBELI, GW
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1965,
26
(02)
: 343
-
&
[2]
ARCHER RJ, 1964, NBS256 MISC PUBL, P255
[3]
ELLIPSOMETRY AND THEORY OF PHOTON SCATTERING FROM SURFACES
ATKINS, PW
论文数:
0
引用数:
0
h-index:
0
ATKINS, PW
WILSON, AD
论文数:
0
引用数:
0
h-index:
0
WILSON, AD
[J].
SURFACE SCIENCE,
1970,
22
(02)
: 433
-
&
[4]
UNIFIED ANALYSIS OF ELLIPSOMETRY ERRORS DUE TO IMPERFECT COMPONENTS, CELL-WINDOW BIREFRINGENCE, AND INCORRECT AZIMUTH ANGLES
AZZAM, RMA
论文数:
0
引用数:
0
h-index:
0
AZZAM, RMA
BASHARA, NM
论文数:
0
引用数:
0
h-index:
0
BASHARA, NM
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1971,
61
(05)
: 600
-
&
[5]
A RADIOTRACER STUDY OF AN OPTICAL METHOD FOR MEASURING ADSORPTION
BARTELL, LS
论文数:
0
引用数:
0
h-index:
0
BARTELL, LS
BETTS, JF
论文数:
0
引用数:
0
h-index:
0
BETTS, JF
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1960,
64
(08)
: 1075
-
1076
[6]
MEASUREMENT OF REFRACTIVE INDICES OF SEVERAL CRYSTALS
BOND, WL
论文数:
0
引用数:
0
h-index:
0
BOND, WL
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(05)
: 1674
-
&
[7]
ELLIPSOMETRIC INVESTIGATION OF PHYSISORPTION AT LOW TEMPERATURES
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
MEYER, F
[J].
SURFACE SCIENCE,
1969,
13
(01)
: 110
-
&
[8]
ELLIPSOMETRY IN SUB-MONOLAYER REGION
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
MEYER, F
[J].
SURFACE SCIENCE,
1969,
14
(01)
: 52
-
&
[9]
ELECTRONIC-STRUCTURE OF (111) SURFACE OF SILICON
BORTOLANI, V
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, INST FIS, 41100 MODENA, ITALY
BORTOLANI, V
CALANDRA, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, INST FIS, 41100 MODENA, ITALY
CALANDRA, C
KELLY, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, INST FIS, 41100 MODENA, ITALY
KELLY, MJ
[J].
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS,
1973,
6
(18):
: L349
-
L353
[10]
ELLIPSOMETRY-LEED STUDY OF ADSORPTION OF OXYGEN ON (011) TUNGSTEN
CARROLL, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
National Bureau of Standards, Washington
CARROLL, JJ
MELMED, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
National Bureau of Standards, Washington
MELMED, AJ
[J].
SURFACE SCIENCE,
1969,
16
: 251
-
&
←
1
2
3
4
→
共 39 条
[1]
MEASUREMENT OF OXYGEN ADSORPTION ON SILICON BYELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
GOBELI, GW
论文数:
0
引用数:
0
h-index:
0
GOBELI, GW
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1965,
26
(02)
: 343
-
&
[2]
ARCHER RJ, 1964, NBS256 MISC PUBL, P255
[3]
ELLIPSOMETRY AND THEORY OF PHOTON SCATTERING FROM SURFACES
ATKINS, PW
论文数:
0
引用数:
0
h-index:
0
ATKINS, PW
WILSON, AD
论文数:
0
引用数:
0
h-index:
0
WILSON, AD
[J].
SURFACE SCIENCE,
1970,
22
(02)
: 433
-
&
[4]
UNIFIED ANALYSIS OF ELLIPSOMETRY ERRORS DUE TO IMPERFECT COMPONENTS, CELL-WINDOW BIREFRINGENCE, AND INCORRECT AZIMUTH ANGLES
AZZAM, RMA
论文数:
0
引用数:
0
h-index:
0
AZZAM, RMA
BASHARA, NM
论文数:
0
引用数:
0
h-index:
0
BASHARA, NM
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1971,
61
(05)
: 600
-
&
[5]
A RADIOTRACER STUDY OF AN OPTICAL METHOD FOR MEASURING ADSORPTION
BARTELL, LS
论文数:
0
引用数:
0
h-index:
0
BARTELL, LS
BETTS, JF
论文数:
0
引用数:
0
h-index:
0
BETTS, JF
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1960,
64
(08)
: 1075
-
1076
[6]
MEASUREMENT OF REFRACTIVE INDICES OF SEVERAL CRYSTALS
BOND, WL
论文数:
0
引用数:
0
h-index:
0
BOND, WL
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(05)
: 1674
-
&
[7]
ELLIPSOMETRIC INVESTIGATION OF PHYSISORPTION AT LOW TEMPERATURES
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
MEYER, F
[J].
SURFACE SCIENCE,
1969,
13
(01)
: 110
-
&
[8]
ELLIPSOMETRY IN SUB-MONOLAYER REGION
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
MEYER, F
[J].
SURFACE SCIENCE,
1969,
14
(01)
: 52
-
&
[9]
ELECTRONIC-STRUCTURE OF (111) SURFACE OF SILICON
BORTOLANI, V
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, INST FIS, 41100 MODENA, ITALY
BORTOLANI, V
CALANDRA, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, INST FIS, 41100 MODENA, ITALY
CALANDRA, C
KELLY, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MODENA, INST FIS, 41100 MODENA, ITALY
KELLY, MJ
[J].
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS,
1973,
6
(18):
: L349
-
L353
[10]
ELLIPSOMETRY-LEED STUDY OF ADSORPTION OF OXYGEN ON (011) TUNGSTEN
CARROLL, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
National Bureau of Standards, Washington
CARROLL, JJ
MELMED, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
National Bureau of Standards, Washington
MELMED, AJ
[J].
SURFACE SCIENCE,
1969,
16
: 251
-
&
←
1
2
3
4
→