IMAGE-PROCESSING IN TEM USING THE WAVELET TRANSFORM

被引：4

作者：

DELRIO, LB

GOMEZ, A

JOSEYACAMAN, M

机构：

[1] Instituto de Física, Universidad Nacional Autónoma de México, 01000 México, Apdo. Postal 20-364, Delegacion Alvaro Obregon

来源：

ULTRAMICROSCOPY | 1991年 / 38卷 / 3-4期

关键词：

D O I：

10.1016/0304-3991(91)90165-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In this work the wavelet transform is used to process electron micrographs and simulated images. It is concluded that the edge sensitivity of the technique and its contrast enhancement capabilities are most useful in the processing of electron micrographs. In particular it is shown that the wavelet transform has some distinctive advantages over conventional Fourier transform filtering when analyzing images from samples that contain boundaries.

引用

页码：319 / 324

页数：6

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