THE DESIGN OF A RADIOCARBON MICROPROBE FOR TRACER MAPPING IN BIOLOGICAL SPECIMENS

被引:9
作者
FREEMAN, SPHT
BRONK, CR
HEDGES, REM
机构
[1] Radiocarbon Accelerator Unit, The Research Laboratory for Archaeology and the History of Art, Oxford, OX1 3QJ
关键词
D O I
10.1016/0168-583X(90)90446-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Biological scientists use radioisotopes to label and subsequently monitor specific molecules within living systems. We aim to improve on conventional methods of imaging C-14 tracers, in both sensitivity and resolution, by combining a new scanning-beam ion source generating C- secondary ions with our AMS system. Our measurements, including that of the generation of sufficient C- ions to the quantity of tissue sputtered, demonstrate that the radiocarbon microprobe is feasible, and we expect its sensitivity to be 1 C-14 label atom in 2000. We have employed the negative ion production enhancing effect of surface caesiation, investigating the potential of a Cs vapour spray for this purpose. As suitable Cs+ ion sources are unavailable, the microprobe will feature a Cs spray to compensate for the lack of primary beam surface caesiation, in conjunction with a 0.2-mu-m spot Ga+ beam.
引用
收藏
页码:405 / 409
页数:5
相关论文
共 13 条
[1]  
BENNINGHOVEN A, 1986, P SECONDARY ION MASS, V6
[2]  
CHASSARDBOUCHAU.C, 1988, P SECONDARY ION MASS, V6, P855
[4]  
HINDIE E, 1988, SCANNING MICROSCOPY, V2, P1821
[5]  
HINDIE E, 1988, P SECONDARY ION MASS, V6, P881
[6]  
LEAR J L, 1986, P197
[7]   ELECTRONIC-PROPERTIES OF CS-COVERED SURFACES OF GRAPHITE (0001) [J].
OKUYAMA, N ;
YAMAZAKI, M ;
TOMITA, K ;
YASUNAGA, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1986, 25 (02) :178-182
[8]   SPUTTERING NEGATIVE CARBON-IONS FROM CESIATED GRAPHITE SURFACES [J].
PARGELLIS, A ;
SEIDL, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03) :1388-1393
[9]   APPLICATIONS OF MICROFOCUSED ION-BEAMS IN SURFACE AND THIN-FILM ANALYSIS [J].
THURSTANS, RE ;
WOLSTENHOLME, J .
VACUUM, 1987, 37 (3-4) :289-291
[10]   FOCUSED ION-BEAM MILLING [J].
WATKINS, REJ ;
ROCKETT, P ;
THOMS, S ;
CLAMPITT, R ;
SYMS, R .
VACUUM, 1986, 36 (11-12) :961-967