CHARACTERISTICS OF THINNED BACKSIDE-ILLUMINATED CHARGE-COUPLED DEVICE IMAGERS

被引：23

作者：

SHORTES, SR ^{[1
]}

CHAN, WW ^{[1
]}

RHINES, WC ^{[1
]}

BARTON, JB ^{[1
]}

COLLINS, DR ^{[1
]}

机构：

[1] TEXAS INSTRUMENTS INC,DALLAS,TX 75222

来源：

关键词：

D O I：

10.1063/1.1655055

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：565 / 567

页数：3

共 10 条

[1] EXPERIMENTAL VERIFICATION OF CHARGE COUPLED DEVICE CONCEPT
AMELIO, GF
TOMPSETT, MF
SMITH, GE
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 593 - +
[2] CHARGE COUPLED SEMICONDUCTOR DEVICES
BOYLE, WS
SMITH, GE
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 587 - +
[3] INFLUENCE OF BULK AND SURFACE PROPERTIES ON IMAGE SENSING SILICON DIODE ARRAYS
BUCK, TM
CASEY, HC
DALTON, JV
YAMIN, M
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1968, 47 (09): : 1827 - +
[4] CAMPANA SB, UNPUBLISHED
[5] CHARGE-COUPLED DEVICES FABRICATED USING ALUMINUM-ANODIZED ALUMINUM-ALUMINUM DOUBLE-LEVEL METALIZATION
COLLINS, DR
SHORTES, SR
MCMAHON, WR
BRACKEN, RC
PENN, TC
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (04) : 521 - 526
[6] A CAMERA TUBE WITH SILICON DIODE ARRAY TARGET
CROWELL, MH
BUCK, TM
LABUDA, EF
DALTON, JV
WALSH, EJ
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (02): : 491 - +
[7] MELEN RD, 1973, 1973 IEEE INT SOL ST, P130
[8] Shortes S. R., 1973, 1973 International Electron Devices Meeting Technical Digest, DOI 10.1109/IEDM.1973.188746
[9] CHARGE COUPLED 8-BIT SHIFT REGISTER
TOMPSETT, MF
AMELIO, GF
SMITH, GE
[J]. APPLIED PHYSICS LETTERS, 1970, 17 (03) : 111 - &
[10] TOMPSETT MF, 1971, IEEE T ELECTRON DEV, VED18, P992