SURFACE SEGREGATION OF SB IN DOPED TIO2 RUTILE

被引：43

作者：

GULINO, A ^{[1
]}

CONDORELLI, GG ^{[1
]}

FRAGALA, I ^{[1
]}

EGDELL, RG ^{[1
]}

机构：

[1] UNIV OXFORD,INORGAN CHEM LAB,OXFORD OX1 3QR,ENGLAND

来源：

APPLIED SURFACE SCIENCE | 1995年 / 90卷 / 03期

关键词：

D O I：

10.1016/0169-4332(95)00160-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The surface concentration of Sb in doped TiO2 rutile ceramics (T1-5/4xSbxO2 0 < x < 0.1), has been measured by means of angle-resolved core level X-ray photoelectron spectroscopy (AR-XPS). Depth profiles have been obtained by alternating Ar+-ion bombardment with core level measurements. At low doping levels Sb segregates by substitutional replacement of Ti in a large number of ionic planes whilst at higher Sb doping levels there is evidence of a new Sb-Ti-O amorphous surface phase whose thickness involves about five ionic planes. A rationalization of the monotonic decrease of the work function throughout the doping range studied has been proposed,

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页码：289 / 295

页数：7

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