DESIGN AND CHARACTERISTICS OF THE LIGHTLY DOPED DRAIN-SOURCE (LDD) INSULATED GATE FIELD-EFFECT TRANSISTOR

被引:230
作者
OGURA, S
TSANG, PJ
WALKER, WW
CRITCHLOW, DL
SHEPARD, JF
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关键词
D O I
10.1109/T-ED.1980.20040
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1359 / 1367
页数:9
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共 23 条
  • [1] HOT-CARRIER INSTABILITY IN IGFETS
    ABBAS, SA
    DOCKERTY, RC
    [J]. APPLIED PHYSICS LETTERS, 1975, 27 (03) : 147 - 148
  • [2] ANTONIADIS DA, 1978, 50192 STANF EL LAB T
  • [3] CHATTERJEE PK, 1979, IEDM, P14
  • [4] HOT-ELECTRON EMISSION IN N-CHANNEL IGFETS
    COTTRELL, PE
    TROUTMAN, RR
    NING, TH
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) : 442 - 455
  • [5] COTTRELL PE, 1975, IEDM TECH DIG, P51
  • [6] DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS
    DENNARD, RH
    GAENSSLEN, FH
    YU, HN
    RIDEOUT, VL
    BASSOUS, E
    LEBLANC, AR
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) : 256 - 268
  • [7] 1 MU-M MOSFET VLSI TECHNOLOGY .2. DEVICE DESIGNS AND CHARACTERISTICS FOR HIGH-PERFORMANCE LOGIC APPLICATIONS
    DENNARD, RH
    GAENSSLEN, FH
    WALKER, EJ
    COOK, PW
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) : 247 - 255
  • [8] Grove A.S., 1967, PHYS TECHNOL S, P193
  • [9] A NEW INSTABILITY IN MOS TRANSISTOR CAUSED BY HOT ELECTRON AND HOLE INJECTION FROM DRAIN AVALANCHE PLASMA INTO GATE OXIDE
    HARA, H
    OKAMOTO, Y
    OHNUMA, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1970, 9 (09) : 1103 - +
  • [10] KOHYAMA S, 1979, 11TH C SOL STAT DEV, pA2