共 6 条
LATERAL EPITAXIAL-GROWTH IN POLY-SI FILM OVER SIO2 FROM SINGLE-SI SEED BY SCANNING CW AR LASER ANNEALING
被引:21
作者:

SAKURAI, J
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KAWAMURA, S
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MORI, H
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NAKANO, M
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D O I:
10.1143/JJAP.20.L176
中图分类号:
O59 [应用物理学];
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页码:L176 / L178
页数:3
相关论文
共 6 条
- [1] CW LASER ANNEAL OF POLYCRYSTALLINE SILICON - CRYSTALLINE-STRUCTURE, ELECTRICAL-PROPERTIES[J]. APPLIED PHYSICS LETTERS, 1978, 33 (08) : 775 - 778GAT, A论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086GERZBERG, L论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086GIBBONS, JF论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086MAGEE, TJ论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086PENG, J论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086HONG, JD论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086
- [2] CRYSTALLOGRAPHIC ORIENTATION OF SILICON ON AN AMORPHOUS SUBSTRATE USING AN ARTIFICIAL SURFACE-RELIEF GRATING AND LASER CRYSTALLIZATION[J]. APPLIED PHYSICS LETTERS, 1979, 35 (01) : 71 - 74GEIS, MW论文数: 0 引用数: 0 h-index: 0机构: Lincoln Laboratory, Massachusetts Institute of Technology, LexingtonFLANDERS, DC论文数: 0 引用数: 0 h-index: 0机构: Lincoln Laboratory, Massachusetts Institute of Technology, LexingtonSMITH, HI论文数: 0 引用数: 0 h-index: 0机构: Lincoln Laboratory, Massachusetts Institute of Technology, Lexington
- [3] CW LASER RECRYSTALLIZATION OF (100) SI ON AMORPHOUS SUBSTRATES[J]. APPLIED PHYSICS LETTERS, 1979, 34 (12) : 831 - 833GIBBONS, JF论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086LEE, KF论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086MAGEE, TJ论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086PENG, J论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086ORMOND, R论文数: 0 引用数: 0 h-index: 0机构: ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086 ADV RES & APPLICAT CORP,SUNNYVALE,CA 94086
- [4] THIN-FILM MOSFETS FABRICATED IN LASER-ANNEALED POLYCRYSTALLINE SILICON[J]. APPLIED PHYSICS LETTERS, 1979, 35 (02) : 173 - 175LEE, KF论文数: 0 引用数: 0 h-index: 0机构: HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304 HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304GIBBONS, JF论文数: 0 引用数: 0 h-index: 0机构: HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304 HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304SARASWAT, KC论文数: 0 引用数: 0 h-index: 0机构: HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304 HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
- [5] SI BRIDGING EPITAXY FROM SI WINDOWS ONTO SIO2 BY Q-SWITCHED RUBY-LASER PULSE ANNEALING[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (01) : L23 - L26TAMURA, M论文数: 0 引用数: 0 h-index: 0TAMURA, H论文数: 0 引用数: 0 h-index: 0TOKUYAMA, T论文数: 0 引用数: 0 h-index: 0
- [6] SILICON-ON-INSULATOR MOSFETS FABRICATED ON LASER-ANNEALED POLYSILICON ON SIO2[J]. ELECTRONICS LETTERS, 1979, 15 (14) : 435 - 437TASCH, AF论文数: 0 引用数: 0 h-index: 0机构: STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305 STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305HOLLOWAY, TC论文数: 0 引用数: 0 h-index: 0机构: STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305 STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305LEE, KF论文数: 0 引用数: 0 h-index: 0机构: STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305 STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305GIBBONS, JF论文数: 0 引用数: 0 h-index: 0机构: STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305 STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305