LATERAL EPITAXIAL-GROWTH IN POLY-SI FILM OVER SIO2 FROM SINGLE-SI SEED BY SCANNING CW AR LASER ANNEALING

被引:21
作者
SAKURAI, J
KAWAMURA, S
MORI, H
NAKANO, M
机构
关键词
D O I
10.1143/JJAP.20.L176
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:L176 / L178
页数:3
相关论文
共 6 条
  • [1] CW LASER ANNEAL OF POLYCRYSTALLINE SILICON - CRYSTALLINE-STRUCTURE, ELECTRICAL-PROPERTIES
    GAT, A
    GERZBERG, L
    GIBBONS, JF
    MAGEE, TJ
    PENG, J
    HONG, JD
    [J]. APPLIED PHYSICS LETTERS, 1978, 33 (08) : 775 - 778
  • [2] CRYSTALLOGRAPHIC ORIENTATION OF SILICON ON AN AMORPHOUS SUBSTRATE USING AN ARTIFICIAL SURFACE-RELIEF GRATING AND LASER CRYSTALLIZATION
    GEIS, MW
    FLANDERS, DC
    SMITH, HI
    [J]. APPLIED PHYSICS LETTERS, 1979, 35 (01) : 71 - 74
  • [3] CW LASER RECRYSTALLIZATION OF (100) SI ON AMORPHOUS SUBSTRATES
    GIBBONS, JF
    LEE, KF
    MAGEE, TJ
    PENG, J
    ORMOND, R
    [J]. APPLIED PHYSICS LETTERS, 1979, 34 (12) : 831 - 833
  • [4] THIN-FILM MOSFETS FABRICATED IN LASER-ANNEALED POLYCRYSTALLINE SILICON
    LEE, KF
    GIBBONS, JF
    SARASWAT, KC
    [J]. APPLIED PHYSICS LETTERS, 1979, 35 (02) : 173 - 175
  • [5] SI BRIDGING EPITAXY FROM SI WINDOWS ONTO SIO2 BY Q-SWITCHED RUBY-LASER PULSE ANNEALING
    TAMURA, M
    TAMURA, H
    TOKUYAMA, T
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (01) : L23 - L26
  • [6] SILICON-ON-INSULATOR MOSFETS FABRICATED ON LASER-ANNEALED POLYSILICON ON SIO2
    TASCH, AF
    HOLLOWAY, TC
    LEE, KF
    GIBBONS, JF
    [J]. ELECTRONICS LETTERS, 1979, 15 (14) : 435 - 437