ON THE HEATING OF THE FIBER TIP IN A NEAR-FIELD SCANNING OPTICAL MICROSCOPE

被引：47

作者：

KAVALDJIEV, DI ^{[1
]}

TOLEDOCROW, R ^{[1
]}

VAEZIRAVANI, M ^{[1
]}

机构：

[1] ROCHESTER INST TECHNOL,CTR IMAGING SCI,ROCHESTER,NY 14623

来源：

APPLIED PHYSICS LETTERS | 1995年 / 67卷 / 19期

关键词：

D O I：

10.1063/1.114588

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Variation of the reflectance of the aluminized tip of a near-field scanning optical microscope is used to measure the temperature rise due the confinement of light in the tip. The measurement technique involves a pump-probe beam approach, and uses a two-step process which eliminates the need to know the dependence of the signal on the scattering cross section of the tip. (C) 1995 American Institute of Physics.

引用

页码：2771 / 2773

页数：3

共 15 条

[1] ALTERATIONS OF SINGLE-MOLECULE FLUORESCENCE LIFETIMES IN NEAR-FIELD OPTICAL MICROSCOPY
AMBROSE, WP
GOODWIN, PM
MARTIN, JC
KELLER, RA
[J]. SCIENCE, 1994, 265 (5170) : 364 - 367
[2] NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT
BETZIG, E
TRAUTMAN, JK
[J]. SCIENCE, 1992, 257 (5067) : 189 - 195
[3] COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY
BETZIG, E
FINN, PL
WEINER, JS
[J]. APPLIED PHYSICS LETTERS, 1992, 60 (20) : 2484 - 2486
[4] NEAR-FIELD MAGNETOOPTICS AND HIGH-DENSITY DATA-STORAGE
BETZIG, E
TRAUTMAN, JK
WOLFE, R
GYORGY, EM
FINN, PL
KRYDER, MH
CHANG, CH
[J]. APPLIED PHYSICS LETTERS, 1992, 61 (02) : 142 - 144
[5] THERMOMECHANICAL DATA-STORAGE USING A FIBER OPTIC STYLUS
HOEN, S
MAMIN, HJ
RUGAR, D
[J]. APPLIED PHYSICS LETTERS, 1994, 64 (03) : 267 - 268
[6] PIEZOELECTRIC TIP-SAMPLE DISTANCE CONTROL FOR NEAR-FIELD OPTICAL MICROSCOPES
KARRAI, K
GROBER, RD
[J]. APPLIED PHYSICS LETTERS, 1995, 66 (14) : 1842 - 1844
[7] KURPAS VV, 1995, P SOC PHOTO-OPT INS, V2384, P128, DOI 10.1117/12.205920
[8] OPTICAL STETHOSCOPY - IMAGE RECORDING WITH RESOLUTION LAMBDA/20
POHL, DW
DENK, W
LANZ, M
[J]. APPLIED PHYSICS LETTERS, 1984, 44 (07) : 651 - 653
[9] NEAR-FIELD PROBE MICROSCOPY OF POROUS SILICON - OBSERVATION OF SPECTRAL SHIFTS IN PHOTOLUMINESCENCE OF SMALL PARTICLES
ROGERS, JK
SEIFERTH, F
VAEZIRAVANI, M
[J]. APPLIED PHYSICS LETTERS, 1995, 66 (24) : 3260 - 3262
[10] DETECTION OF THERMAL WAVES THROUGH OPTICAL REFLECTANCE
ROSENCWAIG, A
OPSAL, J
SMITH, WL
WILLENBORG, DL
[J]. APPLIED PHYSICS LETTERS, 1985, 46 (11) : 1013 - 1015

← 1 2 →