A LOCALIZED TRACE-ELEMENT ANALYSIS OF WATER TREES IN XLPE CABLE INSULATION BY MICRO-PIXE AND EDX

被引：15

作者：

HINRICHSEN, PF

HOUDAYER, A

BELHADFA, A

CRINE, JP

PELISSOU, S

CHOLEWA, M

机构：

[1] HYDRO QUEBEC INST RES,VARENNES J0L 2P0,QUEBEC,CANADA

[2] BROOKHAVEN NATL LAB,UPTON,NY 11973

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1988年 / 23卷 / 06期

基金：

加拿大自然科学与工程研究理事会;

关键词：

Electric Insulating Materials--Plastics - Polyethylenes--Electric Properties - Protons - X-Ray Analysis;

D O I：

10.1109/14.16522

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

PIXE (proton-induced X-ray emission) with a focused proton beam of 30-or 220-μm diameter and EDX (energy dispersive X-ray analysis) of water-trees in XLPE HV (cross-linked polyethylene high-voltage) cable insulation. The merits of these two methods are compared and discussed. It is shown that water-trees are more contaminated than the surrounding insulation. On a localized basis the impurity content of the untreed insulation varies considerably within a few square millimeters.

引用

页码：971 / 978

页数：8

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