TESTABILITY ANALYSIS OF ANALOG SYSTEMS

被引：24

作者：

HEMINK, GJ ^{[1
]}

MEIJER, BW ^{[1
]}

KERKHOFF, HG ^{[1
]}

机构：

[1] PHILIPS COMPONENTS,6534 AE NIJMEGEN,NETHERLANDS

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1990年 / 9卷 / 06期

关键词：

D O I：

10.1109/43.55186

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper a new method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present. © 1990 IEEE

引用

页码：573 / 583

页数：11

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